Document Type
Article
Version
Publisher's PDF
Publication Title
Journal of Applied Physics
Volume
93
Publication Date
2003
Abstract
Epitaxial ZnO thin film doped with 7% Mn have been made by reactive rf magnetron sputtering onto (1120) sapphire substrates at 400 °C. X-ray diffraction measurements reveal that the Zn0.93Mn0.07O film has a (0001) wurtzite single-crystal structure with a rocking curve width od 0.98°. UV-VIS absorption spectra show a band gap of 3.25 eV for pure ZnO films and 3.31 eV for the Zn0.93Mn0.07O film with states extending into the gap. The Auger electron spectroscopy shows homogeneous distribution of Mn in the film. The magnetic properties of the Zn0.93Mn0.07O film have been measured by a superconducting quantum interference device magnetometer at various temperatures with fields up to 5 T. No ferromagnetic ordering has been observed at temperature at 5 K. Instead, paramagnetic characteristics with a Curie-Weiss behavior have been observed.
Publisher's Statement
Copyright (2003) American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics. The following article appeared in J. Appl. Phys. 93, 7876 (2003), and may be found at http://jap.aip.org/resource/1/japiau/v93/i10/p7876_s1.
Citation
X. M. Cheng and C. L. Chien, J. Appl. Phys. 93, 7876 (2003).
DOI
10.1063/1.1556125